Surface processes leading to carbon contamination of photochemically deposited copper filmsF.A. HouleR.J. Wilsonet al.1986JVSTA
High resolution electron energy loss study of AlxGax_xAs mixed crystalsT. KuechM. Liehret al.1986JVSTA
A simplified scanning tunneling microscope for surface science studiesJ.E. DemuthR.J. Hamerset al.1986JVSTA
Summary Abstract: Non-bulk-like physical properties of thin films due to ion bombardment during film growthEric Kay1986JVSTA
Summary Abstract: Electron vibrational spectroscopy of polymer-vacuum and polvmer-metal interfacesJ.E. DemuthT.C. Clark1986JVSTA