Summary Abstract: Non-bulk-like physical properties of thin films due to ion bombardment during film growthEric Kay1986JVSTA
Scanning tunneling microscopy studies of Si(111)-2x 1 surfacesR.M. FeenstraW.A. Thompsonet al.1986JVSTA
Surface processes leading to carbon contamination of photochemically deposited copper filmsF.A. HouleR.J. Wilsonet al.1986JVSTA
Summary Abstract: Electron vibrational spectroscopy of polymer-vacuum and polvmer-metal interfacesJ.E. DemuthT.C. Clark1986JVSTA