Oxide characterization and behavior at CuCu and CuCuOx interfaces

Paper

15 Feb 1986

Oxide characterization and behavior at CuCu and CuCuO_x interfaces

No abstract available.

Paper

O.F. Schirmer, W. Berlinger, et al.

Solid State Communications

Conference paper

S. Cohen, T.O. Sedgwick, et al.

MRS Proceedings 1983

Paper

T. Schneider, E. Stoll

Physical Review B

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L.K. Wang, A. Acovic, et al.

MRS Spring Meeting 1993