IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons
- Jack Y. C. Sun
- Matthew R. Wordeman
- 1984
- IEEE T-ED
Paper
Publications
465 results at IEEE T-ED
Electromigration Lifetime Sudies of Submicrometer-Linewidth Al-Cu Conductors
- Subramanian S. Iyer
- Chung-YU Ting
- 1984
- IEEE T-ED
PaperAccuracy of an Effective Channel Length/External Resistance Extraction Algorithm for MOSFET's
- Steven E. Laux
- 1984
- IEEE T-ED
PaperHeat Transfer in Forced Convection Through Fins
- Robert W. Keyes
- 1984
- IEEE T-ED
PaperTransconductance Degradation in Thin-Oxide MOSFET's
- Giorgio Baccarani
- Matthew R. Wordeman
- 1983
- IEEE T-ED
PaperTransient Electronic Transport in InP Under the Condition of High-Energy Electron Injection
- Kevin Brennan
- Karl Hess
- et al.
- 1983
- IEEE T-ED
PaperNumerical Solution of the Semiconductor Transport Equations with Current Boundary Conditions
- Bertrand M. Grossman
- Michael J. Hargrove
- 1983
- IEEE T-ED
PaperA Conduction Model for Semiconductor–Grain-Boundary-Semiconductor Barriers in Polycrystalline-Silicon Films
- Nicky Chau-Chun Lu
- Chih-Yuan Lu
- et al.
- 1983
- IEEE T-ED
PaperVA-8 Germanium MISFETs Exhibiting Low Interface State Density Using Ge3N4 Gate Insulator
- James J. Rosenberg
- 1983
- IEEE T-ED
PaperOn the Current-Voltage Characteristics of n+-p-p+ Diodes
- C.T. Chuang
- 1983
- IEEE T-ED
Paper