The Role of Damage in the Annealing Characteristics of Ion Implanted Si
- Billy L. Crowder
- 1970
- JES
Paper
Publications
26917 results for Science
Probability of Error, Equivocation, and the Chernoff Bound
- Martin E. Hellman
- Josef Raviv
- 1970
- IEEE Trans. Inf. Theory
PaperCovalency and hyperfine structure constant A of iron group impurities in crystals
- E. Šimánek
- K.A. Müller
- 1970
- Journal of Physics and Chemistry of Solids
PaperModulator Frequency Detuning Effects in the FM Mode-Locked. Laser
- Dirk J. Kuizenga
- 1970
- IEEE JQE
PaperInfluence of a dielectric interface on fluorescence decay time
- K.H. Drexhage
- 1970
- Journal of Luminescence
PaperSome observations on the structural and magnetic properties of evaporated cobalt-nickel films
- B.W. Kington
- R. Pascual
- et al.
- 1970
- Thin Solid Films
PaperHigh-Dose Implantations of P, As, and Sb in Silicon: A Comparison of Room-Temperature Implantations Followed by a 550°C Anneal and Implantations Conducted at 600°C
- Billy L. Crowder
- John M. Fairfield
- 1970
- JES
PaperDepth-bounded computation
- H.R. Strong
- 1970
- Journal of Computer and System Sciences
PaperOn factoring positive operators
- J Rissanen
- 1970
- J. Math. Anal. Appl.
PaperIterative Synthesis Methods for a Seismic Array Processor
- Hisashi Kobayashi
- 1970
- IEEE Transactions on Geoscience Electronics
Paper