John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
F. Odeh, I. Tadjbakhsh
Archive for Rational Mechanics and Analysis
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
W.F. Cody, H.M. Gladney, et al.
SPIE Medical Imaging 1994