Voltage‐dependent imaging of antimony on the GaAs(110) surface
- P. Mårtensson
- R.M. Feenstra
- 2011
- Journal of Microscopy
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A real space investigation of the dimer defect structure of Si(001)‐(2times8)
- H. Niehus
- U.K. Köhler
- et al.
- 2011
- Journal of Microscopy
Scanning near‐field optical microscopy (SNOM)
- D. Pohl
- U.Ch. Fischer
- et al.
- 2011
- Journal of Microscopy
Coherent electron emission from point sources
- P.A. Serena
- L. Escapa
- et al.
- 2011
- Journal of Microscopy
Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)
- Oliver C. Wells
- 2011
- Journal of Microscopy
High‐resolution surface scanning electron microscopy of mineralized tissues
- A. Boyde
- A.N. Broers
- 2011
- Journal of Microscopy
Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)
- Oliver C. Wells
- Phillip J. Bailey
- 2011
- Journal of Microscopy
Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope
- Oliver C. Wells
- 2011
- Journal of Microscopy
Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field
- Oliver C. Wells
- Catherine A. Stoye
- 2011
- Journal of Microscopy
Force sensing in scanning tunnelling microscopy: observation of adhesion forces on clean metal surfaces
- U. Dürig
- O. Züger
- et al.
- 2011
- Journal of Microscopy