PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
PaperRelationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic fieldOliver C. Wells, Catherine A. StoyeJournal of Microscopy
PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
PaperSchlieren method as applied to magnetic recording heads in the scanning electron microscopeOliver C. Wells, Matthias BrunnerApplied Physics Letters
