PaperComparison of different models for the generation of electron backscattering patterns in the scanning electron microscopeOliver C. WellsScanning
PaperRelationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic fieldOliver C. Wells, Catherine A. StoyeJournal of Microscopy
PaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)Oliver C. WellsMicroscopy and Microanalysis