PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
Conference paperThe fiftieth anniversary of the first applications of the scanning electron microscope in materials researchKenneth C.A. Smith, Oliver C. Wells, et al.IC-CPO 2006
PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
PaperCollector turret for scanning electron microscopeOliver C. Wells, Conrad G. BremerReview of Scientific Instruments
