A novel SEM with spin polarization analysis
- R. Browning
- T. Vanzandt
- et al.
- 1990
- Journal of Electron Spectroscopy and Related Phenomena
Paper
Publications
1976 results for Impact Science
Molecular orbital theory for the analysis of photoemission spectra
- P.S. Bagus
- D. Coolbaugh
- et al.
- 1990
- Journal of Electron Spectroscopy and Related Phenomena
PaperElectron attenuation lengths at SiO2/Si interfaces
- J.A. Yarmoff
- S.A. Joyce
- et al.
- 1990
- Journal of Electron Spectroscopy and Related Phenomena
PaperHigh resolution electron energy loss spectroscopic characterization of insulators for Si technology
- M. Liehr
- P.A. Thiry
- 1990
- Journal of Electron Spectroscopy and Related Phenomena
PaperAnomalous oxidation of platinum clusters studied by X-ray photoelectron spectroscopy
- F. Parmigiani
- E. Kay
- et al.
- 1990
- Journal of Electron Spectroscopy and Related Phenomena
PaperElectromagnetic radiation from printed traces on a circuit board with coated plastic cover
- Jean-Fu Kiang
- 1990
- IEEE MTT-S International Microwave Symposium Digest
PaperHigh resolution imaging of magnetic domain wall structures using a new spin polarized electron microscope
- T. Vanzandt
- R. Browning
- et al.
- 1990
- Journal of Electron Spectroscopy and Related Phenomena
PaperParamagnetic agents as tracers in magnetic resonance imaging. Extrapolations from Gd-DTPA to everything.
- S.H. Koenig
- 1990
- Acta radiologica. Supplementum
ReviewElectrical properties of DX centers in GaAs and AlGaAs
- P.M. Mooney
- 1989
- Radiation Effects and Defects in Solids
PaperSecondary ion mass spectrometry measurements of deuterium penetration into silicon by low pressure rf glow discharges
- Gottlieb S. Oehrlein
- Gerald J. Scilla
- 1989
- Radiation Effects and Defects in Solids
Paper