Zhiguo Li, Jorma Toppari, et al.
AMIA Annual Symposium 2021
Paper
Background in semiconductor devices
Abstract
The background detected by solid state devices has been measured at 2400 and 3300 m below the surface and the results analysed in terms of contributing components. © 1981.
Related
Colm T. Whelan, R.K. Nesbet, et al.
Journal of Electron Spectroscopy and Related Phenomena
J.F. Ziegler
Nuclear Instruments and Methods
C.K. Chow, S.S.M. Wang, et al.
Computers and Biomedical Research