Andreana Gomez, Sergio Gonzalez, et al.
Toxics
Paper
Background in semiconductor devices
Abstract
The background detected by solid state devices has been measured at 2400 and 3300 m below the surface and the results analysed in terms of contributing components. © 1981.
Related
Jacqueline S. Dron, Minxian Wang, et al.
Circulation: Genomic and Precision Medicine
Uri Kartoun
Transplantation
F. Parmigiani, E. Kay, et al.
Journal of Electron Spectroscopy and Related Phenomena