Publications

35 results for D.W. Dong

Residual Stress, Chemical Etch Rate, Refractive Index, and Density Measurements on SiO₂ Films Prepared Using High Pressure Oxygen
- - E.A. Irene
  - D.W. Dong
  - et al.
- 2019
- JES
Silicon Oxidation Studies: The Oxidation of Heavily B- and P-Doped Single Crystal Silicon
- - E.A. Irene
  - D.W. Dong
- 2019
- JES
Silicon Oxidation Studies: Morphological Aspects of the Oxidation of Polycrystalline Silicon
- - E.A. Irene
  - E. Tierney
  - et al.
- 2019
- JES
Preparation and Some Properties of Chemically Vapor-Deposited Si-Rich SiO and Si3N4 Films
- - D.W. Dong
  - E.A. Irene
  - et al.
- 2019
- JES
Ellipsometry Measurements of Polycrystalline Silicon Films
- - E.A. Irene
  - D.W. Dong
- 2019
- JES
On the Nature of CVD Si-Rich SiO2 and Si3N4 Films
- - E.A. Irene
  - N.J. Chou
  - et al.
- 2019
- JES
Direct Evidence for 1 nm Pores in “Dry” Thermal SiO2 from High Resolution Transmission Electron Microscopy
- - J.M. Gibson
  - D.W. Dong
- 2019
- JES
An XPS and TEM Study of Intrinsic Adhesion Between Polyimide and Cr Films
- - N.J. Chou
  - D.W. Dong
  - et al.
- 2019
- JES
Observation of amorphous silicon regions in silicon-rich silicon dioxide films
- - A. Hartstein
  - J.C. Tsang
  - et al.
- 2008
- Applied Physics Letters
Dual electron injector structure
- - D.J. Dimaria
  - D.W. Dong
- 2008
- Applied Physics Letters