Publications

52 results for O.C. Wells

Imaging at high beam energies in the scanning electron microscope
- - L. Gignac
  - S.H. Boettcher
  - et al.
- 2006
- M&M 2006
The history and future of the SEM - A personal view
- - Oliver C. Wells
- 2006
- M&M 2006
Imaging and analysis of subsurface Cu interconnects by detecting backscattered electrons in the scanning electron microscope
- - L. Gignac
  - M. Kawasaki
  - et al.
- 2005
- Journal of Applied Physics
Top-down topography of deeply etched silicon in the scanning electron microscope
- - Oliver C. Wells
  - Conal E. Murray
  - et al.
- 2004
- Review of Scientific Instruments
Applications of image diagnostics to metrology quality assurance and process control
- - John A. Allgair
  - Victor V. Boksha
  - et al.
- 2003
- SPIE Advanced Microelectronic Manufacturing 2003
Collector turret for scanning electron microscope
- - Oliver C. Wells
  - Conrad G. Bremer
- 2003
- Review of Scientific Instruments
Low-loss image for surface scanning electron microscope
- - Oliver C. Wells
- 2003
- Applied Physics Letters
Coating, mechanical constraints, and pressure effects on electromigration
- - N.G. Ainslie
  - F.M. D'Heurle
  - et al.
- 2003
- Applied Physics Letters
Reversible hillock growth in thin films
- - S.K. Lahiri
  - O.C. Wells
- 2003
- Applied Physics Letters
New contrast mechanism for scanning electron microscope
- - Oliver C. Wells
- 2003
- Applied Physics Letters