F. Jahnel, J.P. Biersack, et al.
Journal of Applied Physics
Paper
Coating, mechanical constraints, and pressure effects on electromigration
Abstract
The effect of the mechanical constraints exerted by coatings upon electromigration in thin films is evaluated on the basis of known pressure effects upon diffusion. © 1972 The American Institute of Physics.
Related
J.E.E. Baglin, H.A. Atwater, et al.
Thin Solid Films
O.C. Wells
MSA Annual Meeting 1993
I. Ohdomari, K.N. Tu, et al.
Applied Physics Letters