The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- Michael. S. Gordon
- Kenneth P. Rodbell
- et al.
- 2015
- IEEE TNS
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126 results for Ken Rodbell
Resistivity of copper interconnects beyond the 7 nm node
- Adam Pyzyna
- Robert L. Bruce
- et al.
- 2015
- VLSI Technology 2015
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
- Nathaniel A. Dodds
- James R. Schwank
- et al.
- 2014
- IEEE TNS
Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- Jonathan A. Pellish
- Paul W. Marshall
- et al.
- 2014
- IEEE TNS
The resilience wall: Cross-layer solution strategies
- Subhasish Mitra
- Pradip Bose
- et al.
- 2014
- VLSI-TSA 2014
Selected topics in ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2013
- IEEE TNS
Ultra low contact resistivities for CMOS beyond 10-nm node
- Zhen Zhang
- Siyuranga Obasa Koswatta
- et al.
- 2013
- IEEE Electron Device Letters
Ultra-low emissivity alpha-particle detection
- Michael S. Gordon
- Kenneth P. Rodbell
- et al.
- 2012
- IEEE TNS
Interconnect material choices for future scaled devices
- Gregory Fritz
- Adam Pyzyna
- et al.
- 2012
- ADMETA 2012