Publications

126 results for Ken Rodbell

The Role of Static Charge in Ultra-Low Alpha Particle Emissivity Measurements
- - Michael. S. Gordon
  - Kenneth P. Rodbell
  - et al.
- 2015
- IEEE TNS
Resistivity of copper interconnects beyond the 7 nm node
- - Adam Pyzyna
  - Robert L. Bruce
  - et al.
- 2015
- VLSI Technology 2015
SOI FinFET soft error upset susceptibility and analysis
- - Phil Oldiges
  - Ken Rodbell
  - et al.
- 2015
- IRPS 2015
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
- - Nathaniel A. Dodds
  - James R. Schwank
  - et al.
- 2014
- IEEE TNS
Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- - Jonathan A. Pellish
  - Paul W. Marshall
  - et al.
- 2014
- IEEE TNS
The resilience wall: Cross-layer solution strategies
- - Subhasish Mitra
  - Pradip Bose
  - et al.
- 2014
- VLSI-TSA 2014
Selected topics in ultra-low emissivity alpha-particle detection
- - Michael S. Gordon
  - Kenneth P. Rodbell
  - et al.
- 2013
- IEEE TNS
Ultra low contact resistivities for CMOS beyond 10-nm node
- - Zhen Zhang
  - Siyuranga Obasa Koswatta
  - et al.
- 2013
- IEEE Electron Device Letters
Ultra-low emissivity alpha-particle detection
- - Michael S. Gordon
  - Kenneth P. Rodbell
  - et al.
- 2012
- IEEE TNS
Interconnect material choices for future scaled devices
- - Gregory Fritz
  - Adam Pyzyna
  - et al.
- 2012
- ADMETA 2012