Conference paper
Stacked devices for SEU immune design
Phil Oldiges, Kenneth P. Rodbell, et al.
IEEE International SOI Conference 2010
Electrically-insulating samples placed on the grounded sample tray in ionization detectors perturb the electric field within the detector. The resulting alpha particle emissivity of the samples is reduced depending on the magnitude and polarity of the surface voltage. Data are shown for samples with positive and negative surface charge, as well as methods to both measure and eliminate the effects of the surface charge.
Phil Oldiges, Kenneth P. Rodbell, et al.
IEEE International SOI Conference 2010
Cyril Cabral Jr., Benjamin Fletcher, et al.
ADMETA 2010
Michael S. Gordon, David F. Heidel, et al.
IEEE TNS
David F. Heidel, Paul W. Marshall, et al.
IEEE TNS