Impact of HK / MG stacks and future device scaling on RTN
- Naoki Tega
- Hiroshi Miki
- et al.
- 2011
- IRPS 2011
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107 results for David J. Frank
Hysteretic drain-current behavior due to random telegraph noise in scaled-down FETs with high-κ/metal-gate stacks
- Hiroshi Miki
- Naoki Tega
- et al.
- 2010
- IEDM 2010
Practical strategies for power-efficient computing technologies
- Leland Chang
- David J. Frank
- et al.
- 2010
- Proceedings of the IEEE
Reduction of random telegraph noise in high-κ / metal-gate stacks for 22 nm generation FETs
- N. Tega
- H. Miki
- et al.
- 2009
- IEDM 2009
A non-iterative compact model for carbon nanotube FETs incorporating source exhaustion effects
- Lan Wei
- David J. Frank
- et al.
- 2009
- IEDM 2009
Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm
- N. Tega
- H. Miki
- et al.
- 2009
- VLSI Technology 2009
Operational amplifier based test structure for quantifying transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2009
- IEEE Trans Semicond Manuf
Upside-down FETS
- D.C. La Tulipe Jr.
- D.J. Frank
- et al.
- 2008
- IEEE International SOI Conference 2008
Operational amplifier based test structure for transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2008
- ICMTS 2008
An analytical model for intrinsic carbon nanotube FETs
- Lan Wei
- David J. Frank
- et al.
- 2008
- ESSDERC 2008