David J. Frank
IBM J. Res. Dev
In this paper, an analytical model of intrinsic carbon-nanotube field-effect transistors is presented. The origins of the channel carriers are analyzed in the ballistic limit. A noniterative surface-potential model is developed based on an analytical electrostatic model and a piecewise constant quantum-capacitance model. The model is computationally efficient with no iteration or numerical integration involved, thus facilitating fast circuit simulation and system optimization. Essential physics such as drain-induced barrier lowering and quantum capacitance are captured with reasonable accuracy. © 2010 IEEE.
David J. Frank
IBM J. Res. Dev
Paul M. Solomon, David J. Frank, et al.
IEDM 2003
Yoonmyung Lee, Daeyeon Kim, et al.
IEEE Transactions on VLSI Systems
Catherine Dubourdieu, John Bruley, et al.
Nature Nanotechnology