Jie Deng, Lan Wei, et al.
VLSI-TSA 2008
In this paper, an analytical model of intrinsic carbon-nanotube field-effect transistors is presented. The origins of the channel carriers are analyzed in the ballistic limit. A noniterative surface-potential model is developed based on an analytical electrostatic model and a piecewise constant quantum-capacitance model. The model is computationally efficient with no iteration or numerical integration involved, thus facilitating fast circuit simulation and system optimization. Essential physics such as drain-induced barrier lowering and quantum capacitance are captured with reasonable accuracy. © 2010 IEEE.
Jie Deng, Lan Wei, et al.
VLSI-TSA 2008
Yong Liu, Ping-Hsuan Hsieh, et al.
ISSCC 2013
Barry P. Linder, James H. Stathis, et al.
IRPS 2003
Kerry Bernstein, David J. Frank, et al.
IBM J. Res. Dev