New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle
- N.A. Dodds
- P.E. Dodd
- et al.
- 2015
- IEEE TNS
Publications
22 results for Paul W. Marshall
Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- Jonathan A. Pellish
- Paul W. Marshall
- et al.
- 2014
- IEEE TNS
Hardness assurance for proton direct ionization-induced SEEs using a high-energy proton beam
- Nathaniel A. Dodds
- James R. Schwank
- et al.
- 2014
- IEEE TNS
Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2012
- IEEE TNS
32 and 45 nm radiation-hardened-by-design (RHBD) SOI latches
- Kenneth P. Rodbell
- David F. Heidel
- et al.
- 2011
- IEEE TNS
Comparison of single and two-photon absorption for laser characterization of single-event upsets in SOI SRAMs
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- IEEE TNS
Hardness assurance testing for proton direct ionization effects
- James R. Schwank
- Marty R. Shaneyfelt
- et al.
- 2011
- RADECS 2011
Recent single event effects compendium of candidate electronics for NASA space systems
- Martha V. O'Bryan
- Kenneth A. LaBel
- et al.
- 2011
- REDW/NSREC 2011
Impact of spacecraft shielding on direct ionization soft error rates for sub-130 nm technologies
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2010
- IEEE TNS
Heavy ion testing with iron at 1 GeV/amu
- Jonathan A. Pellish
- Michael A. Xapsos
- et al.
- 2010
- IEEE TNS