Publications

28 results for Anthony Domenicucci

Formation of Si:CP layer through in-situ doping and implantation process for n-type metal-oxide-semiconductor devices
- - Shogo Mochizuki
  - Rainer Loesing
  - et al.
- 2014
- Thin Solid Films
Dual-lens electron holography for junction profiling and strain mapping on semiconductor devices
- - Yun-Yu Wang
  - Anthony Domenicucci
  - et al.
- 2014
- Electronic Device Failure Analysis
Strain mapping of Si devices with stress memorization processing
- - Y.Y. Wang
  - John Bruley
  - et al.
- 2013
- Applied Physics Letters
Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping
- - Y.Y. Wang
  - J. Li
  - et al.
- 2013
- Ultramicroscopy
New opportunities for SiGe and Ge channel p-FETs
- - S.W. Bedell
  - N. Daval
  - et al.
- 2011
- Microelectronic Engineering
Characterization of novel TiN/HfO₂ metal insulator semiconductor stack for 32nm eDRAM
- - Puneet Goyal
  - Sneha Gupta
  - et al.
- 2010
- IEEE International SOI Conference 2010
Channel Strain Characterization in Embedded SiGe by Nano-beam Diffraction
- - J. Li
  - A. Lamberti
  - et al.
- 2008
- ECS Meeting 2008
Higher hole mobility induced by twisted Direct Silicon Bonding (DSB)
- - M. Hamaguchi
  - H. Yin
  - et al.
- 2008
- VLSI Technology 2008
An investigation of electrical current induced phase transformations in the NiPtSi/polysilicon system
- - Deok-Kee Kim
  - Anthony Domenicucci
  - et al.
- 2008
- Journal of Applied Physics
Hole transport in nanoscale p-type MOSFET SOI devices with high strain
- - H. Nayfeh
  - S.-J. Jeng
  - et al.
- 2007
- DRC 2007