Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown
- Yanfeng Ji
- Chengbin Pan
- et al.
- 2016
- Applied Physics Letters
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62 results for Ernest Y. Wu
Low-κ and High-κ breakdown statistics with variability: Clustering model versus reconstruction methodology (Invited)
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2015
- IPFA 2015
A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- Ernest Y. Wu
- James Stathis
- et al.
- 2015
- IRPS 2015
Multiple breakdown phenomena and modeling for non-uniform dielectric systems
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2014
- IEDM 2014
Reliability challenges for the 10nm node and beyond
- 2014
- IEDM 2014
Spatial mapping of non-uniform time-to-breakdown and physical evidence of defect clustering
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2014
- VLSI Technology 2014
Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2014
- IRPS 2014
A time-dependent clustering model for non-uniform dielectric breakdown
- Ernest Y. Wu
- B. Li
- et al.
- 2013
- IEDM 2013
Deposited ALD SiO2 high-k/metal gate interface for high voltage analog and I/O devices on next generation alternative channels and FINFET device structures
- S. Siddiqui
- M.M. Chowdhury
- et al.
- 2013
- ECS Meeting 2013
Recent advances in dielectric breakdown of modern gate dielectrics
- Ernest Y. Wu
- Jordi Sune
- 2013
- IIRW 2013