Layout dependence of gate dielectric TDDB in HKMG FinFET technology
- Wen Liu
- Ernest Y. Wu
- et al.
- 2016
- IRPS 2016
Publications
65 results for Ernest Y. Wu
Fundamental statistical properties of reconstruction methodology for TDDB with variability in BEOL/MOL/FEOL applications
- Ernest Y. Wu
- James Stathis
- et al.
- 2016
- IRPS 2016
Time-dependent series resistance and implications for voltage acceleration models in BEOL TDDB
- Andrew Kim
- Baozhen Li
- et al.
- 2016
- IRPS 2016
Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown
- Yanfeng Ji
- Chengbin Pan
- et al.
- 2016
- Applied Physics Letters
Low-κ and High-κ breakdown statistics with variability: Clustering model versus reconstruction methodology (Invited)
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2015
- IPFA 2015
A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
- Ernest Y. Wu
- James Stathis
- et al.
- 2015
- IRPS 2015
Multiple breakdown phenomena and modeling for non-uniform dielectric systems
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2014
- IEDM 2014
Reliability challenges for the 10nm node and beyond
- 2014
- IEDM 2014
Spatial mapping of non-uniform time-to-breakdown and physical evidence of defect clustering
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2014
- VLSI Technology 2014
Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2014
- IRPS 2014