Chih-Chao Yang, Fen Chen, et al.
IITC 2012
We report a wide range of experimental observations of multiple breakdown (BD) phenomena in BEOL/FEOL/MOL dielectric systems with large variability (non-uniformity). Newly developed successive breakdown theory of time-dependent clustering model can well capture these multiple BD events with and without correlation. The understanding of these effects can potentially lead to much improved and realistic projection for future technology nodes.
Chih-Chao Yang, Fen Chen, et al.
IITC 2012
Baozhen Li, Andrew Kim, et al.
IRPS 2018
Youngseok Kim, Soon-Cheon Seo, et al.
IEEE Electron Device Letters
Ernest Y. Wu, Baozhen Li
Journal of Applied Physics