Experiments using automated sample plan selection for OPC modeling
- Ramya Viswanathan
- Om Jaiswal
- et al.
- 2015
- SPIE Advanced Lithography 2015
Conference paper
Publications
13 results for Josef Watts
Statistical compact model extraction: A neural network approach
- Janakiraman Viraraghavan
- Shrinivas J. Pandharpure
- et al.
- 2012
- IEEE TCADIS
PaperA fully automated method to create Monte-Carlo MOSFET model libraries for statistical circuit simulations
- Jing Wang
- Henry Trombley
- et al.
- 2012
- NSTI-Nanotech 2012
Conference paperIncluding spatial correlations of channel length and threshold voltage variation in circuit simulations
- Josef Watts
- Henry Trombley
- 2012
- Microelectronics Reliability
PaperScalable thermal resistance model for single and multi-finger silicon-on-insulator MOSFETs
- S. Khandelwal
- Josef Watts
- et al.
- 2011
- ICMTS 2011
Conference paperElements of statistical SPICE models
- Ning Lu
- Josef Watts
- et al.
- 2009
- NSTI-Nanotech 2009
Conference paperBenchmark tests for MOSFET compact models with application to the PSP model
- Xin Li
- Weimin Wu
- et al.
- 2009
- IEEE Transactions on Electron Devices
PaperDistortion simulations with the PSP model: Common-gate circuits
- C. Michael Olsen
- Lawrence F. Wagner
- et al.
- 2007
- RFIC 2007
Conference paperBenchmarking the PSP compact model for MOS transistors
- Xin Li
- Weimin Wu
- et al.
- 2007
- ICMTS 2007
Conference paperModeling MOSFET process variation using PSP
- Josef Watts
- Yoo-Mi Lee
- et al.
- 2007
- NSTI-Nanotech 2007
Conference paper