Optical conductivity of Ni1-xPtxSi monosilicides (0 < x < 0.3) from spectroscopic ellipsometry
- Lina S. Abdallah
- Stefan Zollner
- et al.
- 2014
- JVSTB
Publications
203 results for Christian Lavoie
Formation and texture of palladium germanides studied by in situ X-ray diffraction and pole figure measurements
- F.A. Geenen
- W. Knaepen
- et al.
- 2014
- Thin Solid Films
Optical conductivity of Ni1- XPtx alloys (0< x <0.25) from 0.76 to 6.6 eV
- Lina S. Abdallah
- Tarek M. Tawalbeh
- et al.
- 2014
- AIP Advances
Thin film Ni-Si solid-state reactions: Phase formation sequence on amorphized Si
- Pierre Turcotte-Tremblay
- Matthieu Guihard
- et al.
- 2013
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Multi-technique x-ray and optical characterization of crystalline phase, texture, and electronic structure of atomic layer deposited Hf 1-xZrxO2 gate dielectrics deposited by a cyclical deposition and annealing scheme
- Relja Vasić
- Steven Consiglio
- et al.
- 2013
- Journal of Applied Physics
Effects of temperature dependent pre-amorphization implantation on NiPt silicide formation and thermal stability on Si(100)
- Ahmet S. Ozcan
- Donald Wall
- et al.
- 2013
- Applied Physics Letters
Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates
- Simon Gaudet
- Koen De Keyser
- et al.
- 2013
- JVSTA
Ultra low contact resistivities for CMOS beyond 10-nm node
- Zhen Zhang
- Siyuranga Obasa Koswatta
- et al.
- 2013
- IEEE Electron Device Letters
MnP nanoclusters embedded in GaP epitaxial films grown by organometallic vapor-phase epitaxy: A reciprocal space mapping and transmission electron microscopy study
- Samuel Lambert-Milot
- Simon Gaudet
- et al.
- 2012
- JVSTA
Improved frequency response in a SiGe npn device through improved dopant activation
- Jim Adkisson
- Marwan H. Khater
- et al.
- 2012
- ECS Meeting 2012