Submicron high performance bipolar technology
- T.C. Chen
- J.D. Cressler
- et al.
- 1989
- VLSI Technology 1989
Publications
Date
Featured collections
Popular topics
235 results for Keith A. Jenkins
Experimental low temperature DRAM
- W.H. Henkels
- N.C.-C. Lu
- et al.
- 1989
- VLSI Circuits 1989
Limits to Jitter in Digital CMOS Gates
- Keith A. Jenkins
- 2023
- IEEE SSC-L
Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2016
- IEEE T-ED
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology
- Tony Tae-Hyoung Kim
- Pong-Fei Lu
- et al.
- 2015
- IEEE Transactions on VLSI Systems
Performance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillator
- Chih-Hsiang Ho
- Keith A. Jenkins
- et al.
- 2015
- IEEE T-ED
Long-term NBTI degradation under real-use conditions in IBM microprocessors
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2014
- Microelectronics Reliability
Characterization of TSV-induced loss and substrate noise coupling in advanced three-dimensional CMOS SOI technology
- Xiaoxiong Gu
- Joel A. Silberman
- et al.
- 2013
- IEEE Transactions on CPMT
Linearity of graphene field-effect transistors
- Keith A. Jenkins
- Damon B. Farmer
- et al.
- 2013
- Applied Physics Letters
On-chip circuit to monitor long-term NBTI and PBTI degradation
- Keith A. Jenkins
- Pong-Fei Lu
- 2013
- Microelectronics Reliability