Publications

14 results for Leendert M. Huisman

Diagnosis and characterization of timing-related defects by time-dependent light emission
- - D.R. Knebel
  - P.N. Sanda
  - et al.
- 1998
- IEEE ITC 1998
Yield fluctuations and defect models
- - Leendert M. Huisman
- 1995
- Journal of Electronic Testing
Highly Reliable Symmetric Networks
- - Leendert M. Huisman
  - Sandip Kundu
- 1994
- IEEE TPDS
Symbolic implication in test generation
- - Sandip Kundu
  - I. Nair
  - et al.
- 1992
- European Conference on Design Automation 1992
A small test generator for large designs
- - Sandip Kundu
  - Leendert M. Huisman
  - et al.
- 1992
- IEEE ITC 1992
Fault simulation of logic designs on parallel processors with distributed memory
- - Leendert M. Huisman
  - Raja Daoud
- 1990
- IEEE ITC 1990
Fault simulation on message passing
- - Leendert M. Huisman
  - Raja Daoud
  - et al.
- 1990
- DMCC 1990
Simulation of embedded memories by defective hashing
- - Leendert M. Huisman
- 1990
- IBM J. Res. Dev
The reliability of approximate testabilty measures
- - Leendert M. Huisman
- 1988
- IEEE Design and Test of Computers
TRIM: Testability Range by Ignoring the Memory
- - Larry Carter
  - Leendert M. Huisman
  - et al.
- 1988
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems