Keiji Matsumoto, Hiroyuki Mori, et al.
SEMI-THERM 2014
One of the biggest challenges for future high-performance three dimensional (3D) integrated devices is heat removal from the stacked dies. In this study, thermally enhanced pre-applied type underfills were studied. These materials were formulated considering fillet cracks and delaminations that appeared in thermal cycling tests on 2D organic package. Finally, the applicability for 3D integration processing with the new material was evaluated on a 3D test vehicle assembly. © 2013 IEEE.
Keiji Matsumoto, Hiroyuki Mori, et al.
SEMI-THERM 2014
Shintaro Yamamichi, Akihiro Horibe, et al.
VLSI Technology 2017
Chinami Marushima, Toyohiro Aoki, et al.
ECTC 2022
Toyohiro Aoki, Kazushige Toriyama, et al.
ICEP 2014