Mei-Chen Chuang, J.W. Coburn
Journal of Applied Physics
Within the last few years there has been a considerable effort devoted to developing a more-fundamental understanding of the role of energetic ion bombardment in influencing the kinetics of reactive gas-surface interactions. Much of this work has been directed toward the silicon-fluorine system and still there are unanswered questions as to the primary role of energetic ions. In this discussion, the importance of ion-assisted gas-surface chemistry in plasma-assisted etching will be described and the current state of our microscopic understanding will be summarized. © 1987.
Mei-Chen Chuang, J.W. Coburn
Journal of Applied Physics
H.F. Winters
Tungsten and Other Refractory Metals for VLSI Applications 1985
E.W. Eckstein, J.W. Coburn, et al.
International Journal of Mass Spectrometry and Ion Physics
J.W. Coburn, M. Chen
Journal of Applied Physics