The Effect of Silicon Wafer Imperfections on Minority Carrier Generation and Dielectric Breakdown in MOS Structures

Ranulfo Allen, John Baglin, et al.

J. Photopolym. Sci. Tech.

Elizabeth A. Sholler, Frederick M. Meyer, et al.

SPIE AeroSense 1997

P.C. Pattnaik, D.M. Newns

Physical Review B

R.D. Murphy, R.O. Watts

Journal of Low Temperature Physics