E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
E. Gusev, D.A. Buchanan, et al.
Technical Digest - International Electron Devices Meeting
K. Cheng, A. Khakifirooz, et al.
IEDM 2009
A. Khakifirooz, Kangguo Cheng, et al.
VLSI-TSA 2010
M.M. Frank, V.K. Paruchuri, et al.
VLSI-TSA 2005