Zhen Zhang, F. Pagette, et al.
IEEE Electron Device Letters
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
Zhen Zhang, F. Pagette, et al.
IEEE Electron Device Letters
S.J. Wind, L.T. Shi, et al.
IEDM 1999
K.W. Guarini, P. Solomon, et al.
Technical Digest-International Electron Devices Meeting
P. Solomon, K.W. Guarini, et al.
IEEE Circuits and Devices Magazine