D.-G. Park, Z. Luo, et al.
VLSI Technology 2004
In this letter, we report self-aligned n-channel germanium (Ge) MOSFETs with a thin Ge oxynitride gate dielectric and tungsten gate electrode. Excellent off-state current is achieved through the reduction of junction leakage. For the first time, we have demonstrated an n-channel Ge MOSFET with a subthreshold slope of 150 mV/dec and an on-off current ratio of ∼10 4.
D.-G. Park, Z. Luo, et al.
VLSI Technology 2004
R. Jammy, V. Narayanan, et al.
ISTC 2005
K.L. Lee, D. Boyd, et al.
ESSDERC 2001
A. Khakifirooz, Kangguo Cheng, et al.
VLSI-TSA 2010