PaperApplication of a CF3+Primary Ion Source for Depth Profiling in Secondary Ion Mass SpectrometryWilhad Reuter, Gerald J. ScillaAnalytical Chemistry
PaperInteraction of metals with model polymer surfaces: Core level photoemission studiesP.N. Sanda, J.W. Bartha, et al.JVSTA
PaperChemical reaction and Schottky-barrier formation at V/Si interfacesJ.G. Clabes, G.W. Rubloff, et al.Physical Review B
