Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
Paper
Summary Abstract: The origin of oxidation induced enhancement of Si+ sputter yield in SIMS
Related
Frank Stem
C R C Critical Reviews in Solid State Sciences
Douglass S. Kalika, David W. Giles, et al.
Journal of Rheology
Conference paper
True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997