Journal of Microscopy

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02 Aug 2011

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

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Abstract

No abstract available.

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Applied Physics Letters

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Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

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XY table and tilting stage for scanning electron microscope (SEM)

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Reciprocity between the reflection electron microscope and the low-loss scanning electron microscope

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