Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide

J.R. Thompson, Yang Ren Sun, et al.

Physica A: Statistical Mechanics and its Applications

Eloisa Bentivegna

Big Data 2022

R.W. Gammon, E. Courtens, et al.

Physical Review B

Peter J. Price

Surface Science