Solid State Electronics

Paper

01 Jan 1993

Reduced hot-carrier reliability degradation of x-ray irradiated MOSFETs in a 0.25 μm CMOS technology with ultra-thin gate oxide

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Abstract

No abstract available.

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Current saturation in submicrometer graphene transistors with thin gate dielectric: Experiment, simulation, and theory

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ACS Nano

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Evidence for the heavy-fermion normal state of high-temperature superconductors from the theory of spectroscopy

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Physical Review B

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Superconductivity of lanthanum intermetallic compounds with the Cu₃Au structure

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Journal of Physics and Chemistry of Solids

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Hierarchical hydrodynamic flow confinement: Efficient use and retrieval of chemicals for microscale chemistry on surfaces

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Langmuir

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