Scott L. Anderson, F.A. Houle, et al.
The Journal of Chemical Physics
Photodesorption of SiF3 groups, which are the principal adsorbates on a silicon surface during etching by XeF2, is found to be responsible for the etch-rate enhancement observed under illumination by low-power, cw band-gap radiation. It is proposed that desorption is stimulated by photogenerated- charge-carrier mediated chemical reaction, and not the simple charge trapping and recombination mechanism usually invoked for desorption from semiconductor surfaces. © 1988 The American Physical Society.
Scott L. Anderson, F.A. Houle, et al.
The Journal of Chemical Physics
W.D. Hinsberg, G.M. Wallraff, et al.
American Chemical Society, Polymer Preprints, Division of Polymer Chemistry
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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
F.A. Houle, W.D. Hinsberg, et al.
ACS Spring 1999