Sujata Paul, Frank Yeh, et al.
IEEE Electron Device Letters
Paper
Performance-aware corner model for design for manufacturing
Abstract
We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner (± σ and ±2σ) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications. © 2009 IEEE.
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