Conference paper
Overview paper scanning near-field microscopies
D. Pohl, J.K. Gimzewski
Optics in Complex Systems 1990
The interaction between an Ir tip and an Ir sample was investigated during normal tunneling operation of the scanning tunneling microscope. Force gradients compatible with metallic adhesion were observed within a range of 2 before making contact. Based on the theory of metallic adhesion, a scaling relation is derived which allows the tip geometry and the characteristics of the interaction to be accounted for in a systematic manner. © 1990 The American Physical Society.
D. Pohl, J.K. Gimzewski
Optics in Complex Systems 1990
U.Ch. Fischer, D. Pohl
Physical Review Letters
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Journal of Applied Physics
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Microelectronic Engineering