Swagath Venkataramani, Vijayalakshmi Srinivasan, et al.
ISCA 2021
Ideally, a metal-oxide-semiconductor field-effect transistor (MOSFET) has high drive current and low leakage current. As the MOSFET channel length is reduced to 50 nm and below, the suppression of off-state leakage current becomes an increasingly difficult technological challenge-one that will ultimately limit the scalability of the conventional MOSFET structure. This paper reviews recent research performed at the University of California at Berkeley on advanced transistor structures that can extend the limit of device scaling to below 10 nm for future generations of MOS technology.
Swagath Venkataramani, Vijayalakshmi Srinivasan, et al.
ISCA 2021
Monodeep Kar, Joel Silberman, et al.
ISSCC 2024
Leland Chang, Robert K. Montoye, et al.
IEEE Journal of Solid-State Circuits
Meikei Ieong, Bruce Doris, et al.
ICSICT 2004