Impact ionization, degradation, and breakdown in SiO2
D.J. Dimaria, E. Cartier, et al.
MRS Proceedings 1992
Surface-plasmon-polariton-mediated luminescence is observed when electrons are injected into thin Al films from the conduction band of SiO2. These electron-injector structures are strikingly similar to light-emitting tunnel junctions, although tunneling can be ruled out as the driving mechanism. The emission arises from the energy relaxation of the steady-state hot-electron distribution which exists in the metal under continuous current injection. The same mechanism must explain much of the luminescence from tunnel junctions. © 1983 The American Physical Society.
D.J. Dimaria, E. Cartier, et al.
MRS Proceedings 1992
Stephanie G. Grancharov, Hao Zeng, et al.
Journal of Physical Chemistry B
C. Falcony, J.R. Kirtley, et al.
Journal of Applied Physics
Amiram Ron, D.J. Dimaria
Physical Review B