H.D. Dulman, R.H. Pantell, et al.
Physical Review B
NiMnSb thin films have been etched in plasma chemistries ICl and IBr, under inductively coupled plasma conditions. These interhalogens produce practical etch rates (500-1500 Å/min-1) provided the incident ion energy is above threshold values (∼120 eV for ICl, ∼230eV for IBr) and there is a balance of etch product formation and desorption through control of the ion and reactive neutral fluxes. Both chemistries appear promising for pattern transfer in NiMnSb-based spin polarized magnetic devices. © 1999 The Electrochemical Society. All rights reserved.
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
K.A. Chao
Physical Review B
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters