Yohji Watanabe, Hing Wong, et al.
IEICE Transactions on Electronics
Paper
IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons
Abstract
No abstract available.
Related
Jack Y. C. Sun, Matthew R. Wordeman, et al.
IEEE T-ED
Wen-Hsing Chang, Bijan Davari, et al.
IEEE T-ED
George A. Sai-Halasz, Matthew R. Wordeman, et al.
IEEE Electron Device Letters