Performance measurement and data base design
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
An overview of wafer-level three-dimensional (3D) integration technology is provided. The basic reasoning for pursuing 3D integration is presented, followed by a description of the possible process variations and integration schemes, as well as the process technology elements needed to implement 3D integrated circuits. Detailed descriptions of two wafer-level integration schemes implemented at IBM are given, and the challenges of bringing 3D integration into a production environment are discussed. © Copyright 2008 by International Business Machines Corporation.
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
David A. Selby
IBM J. Res. Dev
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Lerong Cheng, Jinjun Xiong, et al.
ASP-DAC 2008