Conference paper
Performance test case generation for microprocessors
Pradip Bose
VTS 1998
An overview of wafer-level three-dimensional (3D) integration technology is provided. The basic reasoning for pursuing 3D integration is presented, followed by a description of the possible process variations and integration schemes, as well as the process technology elements needed to implement 3D integrated circuits. Detailed descriptions of two wafer-level integration schemes implemented at IBM are given, and the challenges of bringing 3D integration into a production environment are discussed. © Copyright 2008 by International Business Machines Corporation.
Pradip Bose
VTS 1998
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