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IEEE/ACM Transactions on Networking
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
Israel Cidon, Leonidas Georgiadis, et al.
IEEE/ACM Transactions on Networking
N.K. Ratha, A.K. Jain, et al.
Workshop CAMP 2000
Elena Cabrio, Philipp Cimiano, et al.
CLEF 2013
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev