IBM experiments in soft fails in computer electronics (1978-1994)

J.F. Ziegler; H.W. Curtis; H.P. Muhlfeld; C. Montrose; B. Chin; M. Nicewicz; C.A. Russell; W.Y. Wang; L.B. Freeman; P. Hosier; L.E. LaFave; J.L. Walsh; J.M. Orro; G.J. Unger; J.M. Ross; T.J. O&#039;Gorman; B. Messina; T.D. Sullivan; A.J. Sykes; H. Yourke; T.A. Enger; V. Tolat; T.S. Scott; A.H. Taber; R.J. Sussman; W.A. Klein; C.W. Wahaus

doi:10.1147/rd.401.0003

IBM J. Res. Dev

Paper

01 Jan 1996

IBM experiments in soft fails in computer electronics (1978-1994)

View publication

Abstract

This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.

Conference paper

A fast fanout optimization algorithm for near-continuous buffer libraries

David S. Kung

DAC 1998

Conference paper

HINDCAST OF SOIL MOISTURE USING SMAP, LAND SURFACE MODEL OUTPUT DATA, AND REGRESSION METHODS

Maciel Zortea, Miguel Paredes, et al.

IGARSS 2021

Conference paper

Social networks and discovery in the enterprise (SaND)

Inbal Ronen, Elad Shahar, et al.

SIGIR 2009

Paper

Advanced lithography kits: Serifs and hammerhead

Hang-Yip Liu, Steffen Schulze, et al.

Proceedings of SPIE - The International Society for Optical Engineering

View all publications

Abstract

Related

A fast fanout optimization algorithm for near-continuous buffer libraries

HINDCAST OF SOIL MOISTURE USING SMAP, LAND SURFACE MODEL OUTPUT DATA, AND REGRESSION METHODS

Social networks and discovery in the enterprise (SaND)

Advanced lithography kits: Serifs and hammerhead