Robert E. Donovan
INTERSPEECH - Eurospeech 2001
This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.
Robert E. Donovan
INTERSPEECH - Eurospeech 2001
Sabine Deligne, Ellen Eide, et al.
INTERSPEECH - Eurospeech 2001
Hendrik F. Hamann
InterPACK 2013
Charles H. Bennett, Aram W. Harrow, et al.
IEEE Trans. Inf. Theory