Publications

3 results for Hans P. Muhlfeld

Cosmic ray soft error rates of 16-Mb DRAM memory chips
- - James F. Ziegler
  - Martin E. Nelson
  - et al.
- 1998
- IEEE Journal of Solid-State Circuits
IBM experiments in soft fails in computer electronics (1978-1994)
- - J.F. Ziegler
  - H.W. Curtis
  - et al.
- 1996
- IBM J. Res. Dev
Accelerated testing for cosmic soft-error rate
- - J.F. Ziegler
  - H.P. Muhlfeld
  - et al.
- 1996
- IBM J. Res. Dev