J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
We have grown GaAs layers by molecular beam epitaxy at low substrate temperatures (250°C) using the dimer arsenic source As2. Following a one hour anneal at 600°C, the GaAs layers were examined with transmission electron microscopy. The GaAs layers contained arsenic precipitates of average diameter 100 Å and density of 1017 cm-3. © 1991.
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
A. Krol, C.J. Sher, et al.
Surface Science
T.N. Morgan
Semiconductor Science and Technology
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000