Conference paperThe fiftieth anniversary of the first applications of the scanning electron microscope in materials researchKenneth C.A. Smith, Oliver C. Wells, et al.IC-CPO 2006
PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
PaperIsolation of type-2 magnetic contrast in the SEM by a lock-in techniqueOliver C. WellsApplied Physics Letters
PaperSome theoretical aspects of type‐1 magnetic contrast in the scanning electron microscopeOliver C. WellsJournal of Microscopy