M.R. Latta, S.L. Heesacker
Proceedings of SPIE 1989
Direct photoetching of various resists and polymers with a 193-nm ArF excimer laser has been demonstrated by imaging a mask through a projection lens. Feature sizes ranging from 2 to 20 μm have been cleanly etched in 1-μm-thick films.
M.R. Latta, S.L. Heesacker
Proceedings of SPIE 1989
R.T. Kerth, K. Jain, et al.
IEEE Electron Device Letters
M.R. Latta, R.V. Pole
Applied Optics
W.J. Kozlovsky, A.G. Dewey, et al.
SPIE Optical Data Storage Topical Meeting 1992