P. Alnot, D.J. Auerbach, et al.
Surface Science
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
P. Alnot, D.J. Auerbach, et al.
Surface Science
J. Tersoff
Applied Surface Science
Mark W. Dowley
Solid State Communications
A. Krol, C.J. Sher, et al.
Surface Science