Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
J.A. Barker, D. Henderson, et al.
Molecular Physics
J.K. Gimzewski, T.A. Jung, et al.
Surface Science