S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
In this paper we describe a novel method of eliminating charging during the high resolution SEM inspection and dimensional measurements of x-ray and optical masks. A soluble conducting polymer, polyaniline, is spin-coated on the mask and found to prevent charging even at 15 KV. This method is a non-destructive process in contrast to the commonly used technique of metal deposition, since the polymer can be cleanly removed without any damage to the mask. © 1991.
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
P. Alnot, D.J. Auerbach, et al.
Surface Science
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules