Julien Autebert, Aditya Kashyap, et al.
Langmuir
In this paper we describe a novel method of eliminating charging during the high resolution SEM inspection and dimensional measurements of x-ray and optical masks. A soluble conducting polymer, polyaniline, is spin-coated on the mask and found to prevent charging even at 15 KV. This method is a non-destructive process in contrast to the commonly used technique of metal deposition, since the polymer can be cleanly removed without any damage to the mask. © 1991.
Julien Autebert, Aditya Kashyap, et al.
Langmuir
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
K.A. Chao
Physical Review B
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000