William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
In this paper we describe a novel method of eliminating charging during the high resolution SEM inspection and dimensional measurements of x-ray and optical masks. A soluble conducting polymer, polyaniline, is spin-coated on the mask and found to prevent charging even at 15 KV. This method is a non-destructive process in contrast to the commonly used technique of metal deposition, since the polymer can be cleanly removed without any damage to the mask. © 1991.
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
T.N. Morgan
Semiconductor Science and Technology
Frank Stem
C R C Critical Reviews in Solid State Sciences
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters