A. Deutsch, G.V. Kopcsay, et al.
IEEE Topical Meeting EPEPS 1995
This paper compares the major classes of chip-to-chip and on-chips interconnections used in high-performance computers and communication systems. Measurement of dielectric loss is shown and the attenuation is compared for printed-circuit-board, glass-ceramic, thin-film, and on-chip wiring. Simulation results are shown with representative driver and receiver circuits, guidelines are formulated for when losses are significant, and predictions are made for the sustainable brandwidths on useful wiring lengths.
A. Deutsch, G.V. Kopcsay, et al.
IEEE Topical Meeting EPEPS 1995
A. Deutsch, H. Smith, et al.
IEEE Topical Meeting EPEPS 2000
G. Almasi, G. Almasi, et al.
Digest of Technical Papers - IEEE International Solid-State Circuits Conference
A. Deutsch, H. Harrer, et al.
IEDM 1998