E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
To meet the European Union Restriction of Hazardous Substances requirements and the continuing demand for lower costs, finer pitch, and high-reliability flip-chip packaging structures, considerable work is going on in the electronic industry to develop lead-free solutions for flip-chip technology. In this paper various solder-bumping technologies developed for flip-chip applications are reviewed with an emphasis on a new wafer-bumping technology called C NP (Controlled-Collapse-Chip-Connect New Process). Several inherent advantages of C NP technology are discussed over other technologies. This paper will also discuss the recent development and implementation of lead-free C interconnections for 300 mm wafers demonstrated at IBM. In addition, some metallurgical considerations associated with C NP technology are discussed.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Lawrence Suchow, Norman R. Stemple
JES
J.Z. Sun
Journal of Applied Physics
K.A. Chao
Physical Review B